Comments on 'Signature Analysis for Multiple Output Circuits' by R. David

Authors:
R. David
Affiliations:
-
Venue:
IEEE Transactions on Computers
Year:
1990

Citing 1
Cited 4

Signature Analysis for Multiple-Output Circuits

IEEE Transactions on Computers

A Unified Analytical Expression for Aliasing Error Probability Using Single-Input External- and Internal-XOR LFSR

IEEE Transactions on Computers
Notes on Multiple Input Signature Analysis

IEEE Transactions on Computers
Counter-Based Compaction: Delay and Stuck-Open Faults

IEEE Transactions on Computers
Communication issues within high performance computing grids

International Journal of High Performance Computing and Networking

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Abstract

The probability of a fault-free signature has been calculated in the above-named paper and in an earlier paper by the same author. Implicitly, it was considered as the probability of masking due to signature analysis. It is shown here that this does not correspond exactly to the probability of aliasing. A new definition is given. The difference centers on the event where there are no bit errors in the data to be compressed. When the response of the circuit is correct, the signature is fault-free. However, there is no aliasing.