Logic testing and design for testability
Logic testing and design for testability
Logic design principles with emphasis on testable semicustom circuits
Logic design principles with emphasis on testable semicustom circuits
Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
Comments on 'Signature Analysis for Multiple Output Circuits' by R. David
IEEE Transactions on Computers
Aliasing Probability for Multiple Input Signature Analyzer
IEEE Transactions on Computers
Aliasing errors in linear automata used as multiple-input signature analyzers
IBM Journal of Research and Development
Analysis and Design of Linear Finite State Machines for Signature Analysis Testing
IEEE Transactions on Computers
IEEE Design & Test
IEEE Transactions on Computers
Counter-Based Compaction: Delay and Stuck-Open Faults
IEEE Transactions on Computers
Aliasing Error for a Mask ROM Built-In Self-Test
IEEE Transactions on Computers
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Many results regarding the probability of aliasing for multiple-input compactors have been derived under error assumptions that are not very realistic for VLSI circuits. Recently, the value of aliasing probability has been proven to tend to 2/sup -k/, where k is the number of binary memory elements of the linear compactor. This result is based on the assumption that the compactor is characterized by an irreducible polynomial and that the 'no error' vector has a probability different from zero. In these notes, the above result is generalized. More specifically, it is proved that it is valid if any two error vectors, neither of which needs to be the 'no error' vector, have probabilities of occurrence different from zero. To make the error model complete, the situation in which exactly one error vector has a probability different from zero is also considered. For the latter type of error distributions, the test lengths at which aliasing occurs are determined. Simple proofs for the results are provided; they are based on standard linear algebra notions and well-known theorems.