Analysis and Design of Linear Finite State Machines for Signature Analysis Testing

Authors:
Maurizio Damiani;Piero Olivo;Bruno Riccó
Affiliations:
-;-;-
Venue:
IEEE Transactions on Computers
Year:
1991

Citing 2
Cited 6

Signature Analysis for Multiple-Output Circuits

IEEE Transactions on Computers
Shift Register Sequences

Shift Register Sequences

Determining Aliasing Probabilities in BIST by Counting Strings

Journal of Electronic Testing: Theory and Applications
A Bist Scheme for Non-Volatile Memories

Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
Notes on Multiple Input Signature Analysis

IEEE Transactions on Computers
Fault Detection in Multiprocessor Systems and Array Processors

IEEE Transactions on Computers
Can Nonlinear Compactors Be Better than Linear Ones?

IEEE Transactions on Computers
Aliasing Probability Calculations for Arbitrary Compaction under Independently Selected Random Test Vectors

IEEE Transactions on Computers

Quantified Score

Hi-index	14.99

Visualization

Abstract

The authors present a theoretical investigation of the aliasing error probability (AEP) in signature analysis testing by means of linear finite state machines (LFSMs). The equations of the resulting Markov chain model of the LFSM are solved to determine an exact expression of the AEP as a function of the main LFSM features and of the relevant parameters of the testing environment. This expression is used to prove criteria for the synthesis of LFSMs with minimum asymptotic and transient AEP. A fundamental lower bound on the AEP is presented, which represents the performance limit of any LFSM with respect to aliasing minimization. It is shown that the AEP in machines realizing counters mod 2/sup k/-1 is the closest to such a bound, in particular periodically reaching it.