A Unified Analytical Expression for Aliasing Error Probability Using Single-Input External- and Internal-XOR LFSR

Authors:
Mahmoud S. Elsaholy;Samir I. Shaheen;Reda H. Seireg
Affiliations:
Tenth of Ramadan City, Egypt;Cairo Univ., Giza, Egypt;Technical Research Center, Cairo, Egypt
Venue:
IEEE Transactions on Computers
Year:
1998

Citing 5
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Abstract

In this paper, an exact unified analytical expression for the transient (and the steady state) behavior of the Aliasing Error Probability (AEP) of signature analysis testing using single-input external- and internal-XOR LFSR is deduced. The expression, contrary to what is known in the literature, uses the leftmost bit of the LFSR.