A Current Sensor for On-Chip, Non-Intrusive Testing of RF Systems

Authors:
Antonija Soldo;Anand Gopalan;P. R. Mukund;Martin Margala
Affiliations:
-;-;-;-
Venue:
VLSID '04 Proceedings of the 17th International Conference on VLSI Design
Year:
2004

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Abstract

This paper discusses design of a current sensorsuitable for on-chip testing of RF circuits. The proposedsensor detects supply current (Idd) variations, withminimal impact on the circuit performance. Bandwidthof the circuit is 3.4GHz, with a constant gain of 31.7dB.The sensor has been implemented in IBM-6RF, 0.25µCMOS technology, with 2.5V power supply and it offersthe low real estate overhead and high dynamic rangerequired for this application.