Algorithms for fast, memory efficient switch-level fault simulation
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Symbolic Handling of Bridging Fault Effects
Journal of Electronic Testing: Theory and Applications
Functional test generation for non-scan sequential circuits
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
The Dynamic Rollback Problem in Concurrent Event-Driven Fault Simulation
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
PROOFS: a super fast fault simulator for sequential circuits
EURO-DAC '90 Proceedings of the conference on European design automation
Proceedings of the 17th ACM Great Lakes symposium on VLSI
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