Built-In Testing of Memory Using an On-Chip Compact Testing Scheme
IEEE Transactions on Computers
Functional testing of digital systems
DAC '83 Proceedings of the 20th Design Automation Conference
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Built-in Self Testing of Embedded Memories
IEEE Design & Test
An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories
IEEE Transactions on Computers
A March Test for Functional Faults in Semiconductor Random Access Memories
IEEE Transactions on Computers
Designing for scan test of high performance embedded memories
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Balancing structured and ad-hoc design for test: testing of the PowerPC 603TMmicroprocessor
ITC'94 Proceedings of the 1994 international conference on Test
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