A delay test system for high speed logic LSI's
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
IEEE Design & Test
Test generation for delay faults in non-scan and partial scan sequential circuits
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
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