DAC '77 Proceedings of the 14th Design Automation Conference
DAC '77 Proceedings of the 14th Design Automation Conference
A deterministic approach to adjacency testing for delay faults
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
A simplified six-waveform type method for delay fault testing
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
A logic chip delay-test method based on system timing
IBM Journal of Research and Development
Gross delay defect evaluation for a CMOS logic design system product
IBM Journal of Research and Development
Automatic incorporation of on-chip testability circuits
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Correlation-reduced scan-path design to improve delay fault coverage
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
A quantitative measure of robustness for delay fault testing
EURO-DAC '92 Proceedings of the conference on European design automation
A method of delay fault test generation
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
Principles of design automatioon system for very large scale computer design
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
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This paper presents a delay test system which detects the delay faults located in LSI chips.Fault model and the measure of fault coverage are defined.This system features easy to use operation for providing the test data, including fail safe design to violation of scan design rule, quick turn around time for test data generation, and consideration for delay fault analysis.The delay test is applied to the LSIs for M-68X series computers and justified its effectiveness to assure computer system's maximum performance.