Accelerated transition fault simulation
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
A deterministic approach to adjacency testing for delay faults
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Parallel pattern fault simulation of path delay faults
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
A simplified six-waveform type method for delay fault testing
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Synthesis and optimization procedures for robustly delay-fault testable combinational logic circuits
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
An efficient delay test generation system for combinational logic circuits
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
A variable observation time method for testing delay faults
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
A method of delay fault test generation
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
A delay test system for high speed logic LSI's
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
DAC '77 Proceedings of the 14th Design Automation Conference
On Delay Fault Testing in Logic Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
At-speed delay testing of synchronous sequential circuits
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Clock grouping: a low cost DFT methodology for delay testing
DAC '94 Proceedings of the 31st annual Design Automation Conference
ITC '01 Proceedings of the 2001 IEEE International Test Conference
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