A deterministic approach to adjacency testing for delay faults
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
A simplified six-waveform type method for delay fault testing
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
An efficient delay test generation system for combinational logic circuits
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
A variable observation time method for testing delay faults
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Fault simulation, test generation and design for testability to detect delay faults in digital circuits
A method of delay fault test generation
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
A delay test system for high speed logic LSI's
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
Robustness Enhancement and Detection Threshold Reduction in ATPG for Gate Delay Faults
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
DAC '77 Proceedings of the 14th Design Automation Conference
Tests for path delay faults vs. tests for gate delay faults: how different they are
EURO-DAC '94 Proceedings of the conference on European design automation
Diversity Analysis in the Presence of Delay Faults Affecting Duplex Systems
IEEE Transactions on Computers
a fuzzy model for path delay fault detection
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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