Evaluation of Capacitor Ratios in Automated Accurate Common-Centroid Capacitor Arrays

Authors:
DiaaEldin Khalil;Mohamed Dessouky;Vincent Bourguet;Marie-Minerve Louerat;Andreia Cathelin;Hani Ragai
Affiliations:
Ain Shams University, Cairo, Egypt;Ain Shams University, Cairo, Egypt;University of Paris 6, Paris, France;University of Paris 6, Paris, France;STMicroelectronics - Central R&D/DAIS, Crolles, France;Ain Shams University, Cairo, Egypt
Venue:
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Year:
2005

Citing 1
Cited 3

Automatic Generation of Common-Centroid Capacitor Arrays with Arbitrary Capacitor Ratio

Proceedings of the conference on Design, automation and test in Europe

Placement optimization for yield improvement of switched-capacitor analog integrated circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Common-centroid capacitor placement considering systematic and random mismatches in analog integrated circuits

Proceedings of the 48th Design Automation Conference
Optimal common-centroid-based unit capacitor placements for yield enhancement of switched-capacitor circuits

ACM Transactions on Design Automation of Electronic Systems (TODAES)

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Abstract

In this paper, design and measurement results of a test chip that intends to evaluate differences between layout techniques for rectangular unit-capacitor arrays are introduced. Precision capacitor ratios are compared using a switched-capacitor biquad and a pseudo-floating gate configuration. The test chip is used to evaluate the effectiveness of an automatic common-centroid capacitor array generation tool with arbitrary capacitor ratios. Results indicate significant improvements in ratio accuracy, which have a direct impact on a wide range of applications such as filters for wireless communications, hard drives, and high precision baseband processing.