Automatic Generation of Common-Centroid Capacitor Arrays with Arbitrary Capacitor Ratio
Proceedings of the conference on Design, automation and test in Europe
Evaluation of Capacitor Ratios in Automated Accurate Common-Centroid Capacitor Arrays
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Analog placement with common centroid constraints
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Symmetry constraint based on mismatch analysis for analog layout in SOI technology
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Robust Extraction of Spatial Correlation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Impact of Capacitance Correlation on Yield Enhancement of Mixed-Signal/Analog Integrated Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 48th Design Automation Conference
Proceedings of the International Conference on Computer-Aided Design
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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Capacitor mismatch can generally result from two sources of error: random mismatch and systematic mismatch. Random mismatch is caused by process variation, while systematic mismatch is mainly due to an asymmetrical layout and processing gradients. A common centroid structure may be used to reduce systematic mismatch errors, but not random mismatch errors. Based on the spatial correlation model, this paper formulates the placement optimization problem of analog circuits using switched-capacitor techniques. A placement with higher correlation coefficients of the unit capacitors results in a higher acceptance rate, or chip yield. This paper proposes a heuristic algorithm that quickly and automatically derives the placement of the unit capacitors with the highest, or near-highest, correlation coefficients for yield improvement. Results show that the resultant placement derived from the proposed algorithm achieves better yield improvement than that from a common centroid approach. The proposed heuristic algorithm can be applied for any arbitrary capacitor ratios, i.e., more than two capacitors.