Impact of NBTI on SRAM Read Stability and Design for Reliability
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Proceedings of the 43rd annual Design Automation Conference
The Predictive Technology Model in the Late Silicon Era and Beyond
Foundations and Trends in Electronic Design Automation
Efficient variability-aware NBTI and hot carrier circuit reliability analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
| Hi-index | 0.00 |
We present a set of Computer-Aided-Design(CAD) tools to aid design of circuits in the presence of transistor degradation mechanisms. These CAD tools not only provide information on the circuit behavior due to degradation but also provide information on the degradation suffered by the individual components in the design and also provide design guidelines in the form of changes to the component parameters to bring down the degradation to specified values. These tools facilitate the designer during circuit design in the presence of degradation mechanisms like Hot Carrier Injection(HCI) and Negative Bias Temperature Insta-bility(NBTI).