Generating sparse partial inductance matrices with guaranteed stability
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Bounds for BEM capacitance extraction
DAC '97 Proceedings of the 34th annual Design Automation Conference
A fast hierarchical algorithm for 3-D capacitance extraction
DAC '98 Proceedings of the 35th annual Design Automation Conference
Efficient inductance extraction via windowing
Proceedings of the conference on Design, automation and test in Europe
KSim: a stable and efficient RKC simulator for capturing on-chip inductance effect
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
How to efficiently capture on-chip inductance effects: introducing a new circuit element K
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Window-Based Susceptance Models for Large-Scale RLC Circuit Analyses
Proceedings of the conference on Design, automation and test in Europe
A Divide-and-Conquer Algorithm for 3D Capacitance Extraction
ISQED '04 Proceedings of the 5th International Symposium on Quality Electronic Design
INDUCTWISE: inductance-wise interconnect simulator and extractor
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Spatially distributed 3D circuit models are extracted with a segment-to-segment BEM (Boundary Element Method) algorithm for both capacitance and inverse inductance couplings rather than using the traditional net-to-net approach. Critical issues regarding the extraction efficiency and accuracy of segment-to-segment BEM capacitance models are explored. An adaptive discretization scheme is developed for segment-to-segment capacitance extraction and also applied to segment-to-segment high-frequency inverse inductance extraction. We demonstrate the limitations of the duality between capacitance and inverse inductance. Examples demonstrating the accuracy of these models are presented for real packaging cases.