Value-Added Defect Testing Techniques

Authors:
Jay Jahangiri;David Abercrombie
Affiliations:
Mentor Graphics;Mentor Graphics
Venue:
IEEE Design & Test
Year:
2005

Citing 2
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Abstract

This article describes advanced design-for-manufacturability (DFM) test methods that target defect coverage, yield learning, and cost. The authors argue that testing can be useful for more than filtering chips: It can directly help target test patterns, provide DFM tools, and reduce overall costs.