Hardening Techniques against Transient Faults for Asynchronous Circuits

Authors:
Y. Monnet;M. Renaudin;R. Leveugle
Affiliations:
TIMA laboratory;TIMA laboratory;TIMA laboratory
Venue:
IOLTS '05 Proceedings of the 11th IEEE International On-Line Testing Symposium
Year:
2005

Citing 0
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Abstract

This paper presents hardening techniques against transient faults for Quasi Delay Insensitive (QDI) circuits. Because of their specific architecture, asynchronous circuits have a very different behavior than synchronous circuits in the presence of faults. We address the effects of transient faults in QDI circuits and describe consequences on the circuit behavior. Three techniques exploiting QDI circuit properties are proposed for hardening. These techniques improve the tolerance to transient faults, and make their detection easier. These techniques are compared in terms of efficiency and cost.