A Soft Error Monitor Using Switching Current Detection

Authors:
Patrick Ndai;Amit Agarwal;Qikai Chen;Kaushik Roy
Affiliations:
Dept. of ECE, Purdue University, West Lafayette, IN, USA;Dept. of ECE, Purdue University, West Lafayette, IN, USA;Dept. of ECE, Purdue University, West Lafayette, IN, USA;Dept. of ECE, Purdue University, West Lafayette, IN, USA
Venue:
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Year:
2005

Citing 3
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Abstract

Technology scaling has led to a reduction in the stored charge in SRAM memories. This has increased their vulnerability to soft errors. Conventional approaches to detect/correct soft errors, such as ECC, have limitation in the number of soft errors that can be tolerated. In this paper, we propose a soft error detection circuit which utilizes a current mirror to translate switching current pulses induced by soft errors into voltage pulses. This pulse is then sensed by a Schmitt trigger to generate an error signal. Our experimental results show that the proposed scheme is tolerant to process variation and results in low power overhead without significantly affecting performance.