System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Diagnosis of interconnect shorts in mesh NoCs
NOCS '09 Proceedings of the 2009 3rd ACM/IEEE International Symposium on Networks-on-Chip
Improving the yield of NoC-based systems through fault diagnosis and adaptive routing
Journal of Parallel and Distributed Computing
Journal of Electronic Testing: Theory and Applications
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A scheme to functionally test the networking infrastructure of a system within a network on chip is presented. A fault model and a test pattern generation and application algorithm that relies on a network simulator are presented. Experimental results demonstrate the impact of the presented algorithm.