Fault modeling and simulation for crosstalk in system-on-chip interconnects
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
SoCIN: A Parametric and Scalable Network-on-Chip
SBCCI '03 Proceedings of the 16th symposium on Integrated circuits and systems design
RASoC: A Router Soft-Core for Networks-on-Chip
Proceedings of the conference on Design, automation and test in Europe - Volume 3
Reusing an on-chip network for the test of core-based systems
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Methodologies and Algorithms for Testing Switch-Based NoC Interconnects
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
BIST for Network-on-Chip Interconnect Infrastructures
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Interconnect Testing for Networks on Chips
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
A concurrent testing method for NoC switches
Proceedings of the conference on Design, automation and test in Europe: Proceedings
An External Test Approach for Network-on-a-Chip Switches
ATS '06 Proceedings of the 15th Asian Test Symposium
Using the inter- and intra-switch regularity in NoC switch testing
Proceedings of the conference on Design, automation and test in Europe
IEEE Transactions on Computers
Testing and diagnosis of interconnects using boundary scan architecture
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Accelerating Strategy for Functional Test of NoC Communication Fabric
ATS '10 Proceedings of the 2010 19th IEEE Asian Test Symposium
Cost-Effective Power-Aware Core Testing in NoCs Based on a New Unicast-Based Multicast Scheme
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Hi-index | 0.00 |
In this work, a comprehensive functional-based test method is presented to integrate the test of Network-on-Chip interconnects and routers. Experimental results show that fault coverage can reach up to 100% of interconnect faults and over 90% of router faults. The test structures needed to implement the test method are presented and the scalability of the method is discussed. We show that our approach scales well with the number of routers and channel width. The cost of the functional test strategy and the cost of a scan-based strategy are also analyzed in order to present scenarios where each strategy fits better.