Maximal Diagnosis for Wiring Networks
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
SoCIN: A Parametric and Scalable Network-on-Chip
SBCCI '03 Proceedings of the 16th symposium on Integrated circuits and systems design
DyAD: smart routing for networks-on-chip
Proceedings of the 41st annual Design Automation Conference
Reusing an on-chip network for the test of core-based systems
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Methodologies and Algorithms for Testing Switch-Based NoC Interconnects
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
BIST for Network-on-Chip Interconnect Infrastructures
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Interconnect Testing for Networks on Chips
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
On-line Fault Detection and Location for NoC Interconnects
IOLTS '06 Proceedings of the 12th IEEE International Symposium on On-Line Testing
An External Test Approach for Network-on-a-Chip Switches
ATS '06 Proceedings of the 15th Asian Test Symposium
Test Configurations for Diagnosing Faulty Links in NoC Switches
ETS '07 Proceedings of the 12th IEEE European Test Symposium
Testing for Faults in Wiring Networks
IEEE Transactions on Computers
IEEE Transactions on Computers
Bringing communication networks on a chip: test and verification implications
IEEE Communications Magazine
Improving the yield of NoC-based systems through fault diagnosis and adaptive routing
Journal of Parallel and Distributed Computing
A complete self-testing and self-configuring NoC infrastructure for cost-effective MPSoCs
ACM Transactions on Embedded Computing Systems (TECS) - Special Section on Wireless Health Systems, On-Chip and Off-Chip Network Architectures
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We propose a method to diagnose interconnect short-circuit faults in mesh 7oCs. The fault model comprises all shorts between any two wires of a defined 7oC neighborhood. Test sequences are applied in 7oC functional mode. Experimental results show that 93% of the interconnect shorts can be diagnosed.