On-line Fault Detection and Location for NoC Interconnects

  • Authors:
  • Cristian Grecu;Andre Ivanov;Res Saleh;Egor S. Sogomonyan;Partha Pratim Pande

  • Affiliations:
  • University of British Columbia, Canada;University of British Columbia, Canada;University of British Columbia, Canada;University of Potsdam, Germany;Washington State University, USA

  • Venue:
  • IOLTS '06 Proceedings of the 12th IEEE International Symposium on On-Line Testing
  • Year:
  • 2006

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Abstract

Like other silicon integrated circuit (IC) domains, the smart card market is very competitive and main actors are constantly trying to design the cheapest and safest circuits to ensure their consumers' satisfaction. These specificities lead smart cards ...