A signal theory based approach to the statistical analysis of combinatorial nanoelectronic circuits

Authors:
Oliver Soffke;Peter Zipf;Tudor Murgan;Manfred Glesner
Affiliations:
Darmstadt University of Technology, Darmstadt, Germany;Darmstadt University of Technology, Darmstadt, Germany;Darmstadt University of Technology, Darmstadt, Germany;Darmstadt University of Technology, Darmstadt, Germany
Venue:
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Year:
2006

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Abstract

In this paper we present a method which allows the statistical analysis of nanoelectronic Boolean networks with respect to timing uncertainty and noise. All signals are considered to be instationary random processes which is the most general signal representation. As one cannot deal with random processes per se, we focus on certain statistical properties which are propagated through networks of Boolean gates yielding the instationary probability density function (pdf) of each signal in the network. Finally, several values of interest as the error probability, the average path delay or the average signal trace over time can be extracted from these pdf.