WIP evolution of a semiconductor factory after a bottleneck workcenter breakdown
Proceedings of the 30th conference on Winter simulation
A rapid modeling technique for measurable improvements in factory performance
Proceedings of the 30th conference on Winter simulation
Simulation Modeling and Analysis
Simulation Modeling and Analysis
Comparing designs for computer simulation experiments
Proceedings of the 40th Conference on Winter Simulation
Proceedings of the 40th Conference on Winter Simulation
A full-factory simulator as a daily decision-support tool for 300mm wafer fabrication productivity
Proceedings of the 40th Conference on Winter Simulation
Controlled simplification of material flow simulation models
Winter Simulation Conference
Aggregate modeling of semiconductor equipment using effective process times
Proceedings of the Winter Simulation Conference
Proceedings of the Winter Simulation Conference
Proceedings of the Winter Simulation Conference
Single-server aggregation of a re-entrant flow line
Proceedings of the Winter Simulation Conference
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Cycle Time -- Throughput curves (CT-TH), which plot the average cycle time versus start rate for a given product mix, are often used to support decisions made in manufacturing settings, such as the impact of proposed changes in start rate on mean cycle time. Discrete event simulation is often used to generate estimations of cycle time at a significant number of traffic intensities (start rates). However, simulation often requires long run lengths and extensive output analysis. In most manufacturing environments, the time and/or budget available for such simulations is limited. As demands for faster and more accurate results are required, alternative approaches to improving simulation efficiency must be investigated. This research seeks to develop a procedure for simplifying a detailed model into a fast (abstract) simulation model that achieves a statistically indistinguishable level of accuracy and precision. This technique has particular application in the simulation of semiconductor manufacturing facilities.