Surface Reflection: Physical and Geometrical Perspectives
IEEE Transactions on Pattern Analysis and Machine Intelligence
A comprehensive physical model for light reflection
Proceedings of the 18th annual conference on Computer graphics and interactive techniques
Generalization of the Lambertian model and implications for machine vision
International Journal of Computer Vision
Non-linear approximation of reflectance functions
Proceedings of the 24th annual conference on Computer graphics and interactive techniques
Improved Diffuse Reflection Models for Computer Vision
International Journal of Computer Vision
A Reflectance Model for Computer Graphics
ACM Transactions on Graphics (TOG)
Robot Vision
Representing and Recognizing the Visual Appearance of Materials using Three-dimensional Textons
International Journal of Computer Vision
Bidirectional Reflection Distribution Function Expressed in Terms of Surface Scattering Modes
ECCV '96 Proceedings of the 4th European Conference on Computer Vision-Volume II - Volume II
The Effect of Illuminant Rotation on Texture Filters: Lissajous's Ellipses
ECCV '02 Proceedings of the 7th European Conference on Computer Vision-Part III
Reflectance and Texture of Real-World Surfaces Authors
CVPR '97 Proceedings of the 1997 Conference on Computer Vision and Pattern Recognition (CVPR '97)
Surface radiance correction for shape from shading
Pattern Recognition
A Light Scattering Model for Layered Dielectrics with Rough Surface Boundaries
International Journal of Computer Vision
An optimisation approach to the recovery of reflection parameters from a single hyperspectral image
Computer Vision and Image Understanding
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This paper focusses on how reflectance models based on scattering theory and reported in the physics literature can be used for making estimates of surface roughness parameters using reflectance measurements obtained with a digital camera. We commence by reviewing the Beckmann-Kirchhoff (B-K) scatter theory, and the recent modification to it by Vernold and Harvey. We show how this model can be used to estimate surface roughness parameters for dielectric surfaces using pixel brightness measurements. Using the roughness parameter measurements we compare the model with reflectance measurements from the CUReT database. This comparison shows that the Vernold-Harvey modification of the B-K model gives a better fit to data than the Oren-Nayar model for certain types of rough surface.