Fast Simulation of Laplacian Growth

  • Authors:
  • Theodore Kim;Jason Sewall;Avneesh Sud;Ming C. Lin

  • Affiliations:
  • University of North Carolina at Chapel Hill;University of North Carolina at Chapel Hill;University of North Carolina at Chapel Hill;University of North Carolina at Chapel Hill

  • Venue:
  • IEEE Computer Graphics and Applications
  • Year:
  • 2007

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Abstract

Laplacian instability is the physical mechanism driving pattern formation in many disparate natural phenomena. Current algorithms for simulating this instability are slow and memory intensive. A new algorithm, based on the dielectric breakdown model from physics, is more than three orders of magnitude faster than previous methods and decreases memory use by two orders of magnitude.