An embedded multi-resolution AMBA trace analyzer for microprocessor-based SoC integration

Authors:
Chung-Fu Kao;Ing-Jer Huang;Chi-Hung Lin
Affiliations:
National Sun Yat-Sen University, Kaohsiung, Taiwan;National Sun Yat-Sen University, Kaohsiung, Taiwan;National Sun Yat-Sen University, Kaohsiung, Taiwan
Venue:
Proceedings of the 44th annual Design Automation Conference
Year:
2007

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Abstract

The bus tracing is used to catch related signals for further investigation and analysis. However, the trace size of cycle-accurate tracing is large and the trace cycle is shallow unless using a proper compression mechanism. In this paper, we propose an embedded multi-resolution AMBA trace analyzer that provides the trade-off between the trace granularity and the trace depth. It consists of two major trace approaches: (1) the signal monitor/tracing which provides the levels of abstraction, and (2) the trace reduction. In the first approach, it allows designers to zoom-in/out to preferred level of abstraction to serve different debugging purposes. In the second approach, the trace analyzer compresses the traced data according to signal characteristics and the cost of on-chip storage is reduced. The trace data will be decompressed on the host for further observation and debugging. The experimental results show that the proposed approach can reach a good compression ratio of 96% and the trace depth is more than two thousand cycles at the higher abstraction level.