Design of Reliable Synchronous Sequential Circuits

  • Authors:
  • D. H. Sawin

  • Affiliations:
  • Communication/Automatic Data Processing Laboratory, U. S. Army Electronics Command

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1975

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Abstract

Fail-safe synchronous sequential machines produce safeside outputs when failures occur within the machine. This correspondence presents a procedure to design such machines using a modification of the on-set equation form originally presented by Tohma et al. [1] and later improved by Diaz et al. [2]. A systematic procedure for state assignment and next-state equation derivation, using partition theory, is presented. From this method an easily calculated upper bound on the number of gates required-to realize a fail-safe circuit is derived.