Multiple Fault Detection in Combinational Networks
IEEE Transactions on Computers
On the Design of Multiple Fault Diagnosable Networks
IEEE Transactions on Computers
On the Design of Logic Networks with Redundancy and Testability Considerations
IEEE Transactions on Computers
Hazard detection in combinational and sequential switching circuits
SWCT '64 Proceedings of the 1964 Proceedings of the Fifth Annual Symposium on Switching Circuit Theory and Logical Design
Diagnosis of automata failures: a calculus and a method
IBM Journal of Research and Development
A Design for Testability of Undetectable Crosspoint Faults in Programmable Logic Arrays
IEEE Transactions on Computers
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The procedures introduced in this paper convert redundant circuits into irredundant circuits for testing purposes. In a redundant circuit, there are redundant connections which contribute no unique l's or 0's to the output of the circuit. These redundant connections are contained in the circuit for specific purposes, such as hazard protection, integrated circuit standardization, structural purposes, correct operation in the presence of faults, and other reasons. Most faults on these redundant connections cannot be detected due to the unchanging output. An irredundant circuit contains no redundant connections and all lines are completely testable.