Fault Diagnosis of MOS Combinational Networks
IEEE Transactions on Computers
Syndrome-Testable Design of Combinational Circuits
IEEE Transactions on Computers
Syndrome-Testing of " Syndrome-Untestable" Combinational Circuits
IEEE Transactions on Computers
Fault Detection in Fanout-Free Combinational Networks
IEEE Transactions on Computers
A Practical Approach to Fault Detection in Combinational Networks
IEEE Transactions on Computers
Detection of Multiple Faults in Combinational Logic Networks
IEEE Transactions on Computers
Spectral Signature Testing of Multiple Stuck-at Faults in Irredundant Combinational Networks
IEEE Transactions on Computers
A unified view of test compression methods
IEEE Transactions on Computers
Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks
IEEE Transactions on Computers
| Hi-index | 14.99 |
A method is described for the derivation of fault signatures for certain classes or irredundant combinational networks. These signatures consist of a set of values derived from the network. Any stuck-at fault causes at least one of the values to change. The signatures provide complete fault detection for all single stuck-at faults. They are usually short and never contain more than n + 1 values for an n-input network.