Experiences of low power design implementation and verification

  • Authors:
  • Shi-Hao Chen;Jiing-Yuan Lin

  • Affiliations:
  • Global Unichip Corp., Hsin-Chu, Taiwan;Global Unichip Corp., Hsin-Chu, Taiwan

  • Venue:
  • Proceedings of the 2008 Asia and South Pacific Design Automation Conference
  • Year:
  • 2008

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Abstract

In this paper, we present the experiences of some low power solutions that have been successfully implemented in 90nm/65nm production tape-outs. We also focus on power gating design, an effective low leakage solution, and present the experiences of power switch planning, optimization, and verification. Dynamic IR drop is an important issue in low power design, which may reduce the logic gate noise margins and result in functional or timing failures. We will present a low cost but effective methodology for dynamic IR drop prevention and fixing.