Recovering surface reflectance and multiple light locations and intensities from image data

Authors:
S. Xu;A. M. Wallace
Affiliations:
Joint Research Institute in Signal and Image Processing, School of Engineering and Physical Sciences, Heriot-Watt University, Riccarton, Edinburgh EH14 4AS, Scotland, United Kingdom;Joint Research Institute in Signal and Image Processing, School of Engineering and Physical Sciences, Heriot-Watt University, Riccarton, Edinburgh EH14 4AS, Scotland, United Kingdom
Venue:
Pattern Recognition Letters
Year:
2008

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Abstract

We present a method to recover the reflectance of objects and the parameters of multiple lights using a 3D image acquired by a depth sensor and a stereo intensity pair. Experimental evaluation shows the ability to recover varying diffuse and constant specular reflectance parameters from object images, and simultaneously the locations and intensities of up to three distinct light sources.