Enhanced self-test techniques for VLSI systems applied to the IBM enterprise system/900 type 9121 processor

A method for generating weighted random test pattern

IBM Journal of Research and Development

Improved cutting algorithm

IBM Journal of Research and Development

Built-in self-test support in the IBM engineering design system

IBM Journal of Research and Development

A logic design structure for LSI testability

DAC '77 Proceedings of the 14th Design Automation Conference

Probabilistic Treatment of General Combinational Networks

IEEE Transactions on Computers