Compact finite difference schemes for ocean models: 1. Ocean waves
Journal of Computational Physics
The coordination of multiple processes in computer operating systems
The coordination of multiple processes in computer operating systems
AFIPS '68 (Fall, part I) Proceedings of the December 9-11, 1968, fall joint computer conference, part I
Error recovery through programming
AFIPS '68 (Fall, part I) Proceedings of the December 9-11, 1968, fall joint computer conference, part I
AFIPS '70 (Spring) Proceedings of the May 5-7, 1970, spring joint computer conference
A Hardware Redundancy Reconfiguration Scheme for Tolerating Multiple Module Failures
IEEE Transactions on Computers
A Highly Efficient Redundancy Scheme: Self-Purging Redundancy
IEEE Transactions on Computers
Reliability Analysis of Systems with Concurrent Error Detection
IEEE Transactions on Computers
Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults
IEEE Transactions on Computers
An overview of fault-tolerant digital system architecture
AFIPS '77 Proceedings of the June 13-16, 1977, national computer conference
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The theory of fault-tolerant computer design has developed rapidly. Several techniques using hardware or software have been suggested. A student is often faced with the problem of developing a common perspective for a variety of methods. In this paper we attempt to develop a simple framework within which different methods can be compared. We use a set of very elementary indices to construct the framework. The indices are quite crude and our framework is somewhat ad hoc. Though a unified theory would be extremely useful we have not attempted to develop one here. Our discussion is a first pass at identifying some goals of reliable design and an attempt at quantifying some parameters. We discuss only a very small set of the techniques that have been proposed for fault-tolerant computers. Methods for constructing relevant indices for these techniques are presented. We feel that these indices are relevant for most reliability techniques.