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ACM '69 Proceedings of the 1969 24th national conference
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Design of fault-tolerant computers
AFIPS '67 (Fall) Proceedings of the November 14-16, 1967, fall joint computer conference
AFIPS '70 (Spring) Proceedings of the May 5-7, 1970, spring joint computer conference
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AFIPS '72 (Fall, part I) Proceedings of the December 5-7, 1972, fall joint computer conference, part I
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IBM Journal of Research and Development
On-line Testing and Recovery in TMR Systems for Real-Time Applications
ITC '01 Proceedings of the 2001 IEEE International Test Conference
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IEEE Transactions on Computers
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IEEE Transactions on Computers
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IEEE Transactions on Computers
An Algebraic Model of Fault-Masking Logic Circuits
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AFIPS '77 Proceedings of the June 13-16, 1977, national computer conference
Modular redundancy without voters decreases complexity of restoring organ
AFIPS '77 Proceedings of the June 13-16, 1977, national computer conference
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Designs for dlagnosablllty and reliability in VLSI systems
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
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The goals of this paper are to present an efficient redundancy scheme for highly reliable systems, to give a method to compute the exact reliability of such systems and to compare this scheme with other redundancy schemes. This redundancy scheme is self-purging redundancy, a scheme that uses a threshold voter and that purges the failed modules. Switches for self-purging systems are extremely simple: there is no replacement of the failed modules and module purging is quite simply implemented. Because of switch simplicity, exact reliability calculations re possible. The effects of switch reliability are quantitatively examined. For short mission times, switch reliability is the most important factor: self-purging systems have a probability of failure several times larger than the figure obtained when switches are assumed to be perfect. The influence of the relative frequency of the diverse types of failures (permanent, intermittent, stuck-at, multiple,...) is also investigated. Reliability functions, mission time improvements, and switch efficiency are computed and displayed. Self-purging systems are compared with other redundant systems, like hybrid or NMR, for their relative merits in reliability gain, simplicity, cost, and confidence in the reliability estimation. The high confidence in the reliability evaluation of self-purging systems makes them a standard for the validation of several models that have been proposed to take into account switch reliability. The accuracy of the models using coverage factors can be evaluated in this way.