Graph-Based Algorithms for Boolean Function Manipulation
IEEE Transactions on Computers
Estimation of average switching activity in combinational and sequential circuits
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Dependency preserving probabilistic modeling of switching activity using bayesian networks
Proceedings of the 38th annual Design Automation Conference
Fast Power Estimation of Large Circuits
IEEE Design & Test
Mutually Disjoint Signals and Probability Calculation in Digital Circuits
GLS '98 Proceedings of the Great Lakes Symposium on VLSI '98
A Probabilistic Method for the Computation of Testability of RTL Constructs
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Probabilistic Treatment of General Combinational Networks
IEEE Transactions on Computers
A method for switching activity analysis of VHDL-RTL combinatorial circuits
PATMOS'06 Proceedings of the 16th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
Probabilistic modeling of dependencies during switching activity analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
| Hi-index | 0.00 |
This paper presents a partition method for probabilistic switching activity estimation of combinational circuits described at register transfer level (RTL). Probabilistic estimation of switching activity requires large and complex models that could be unfeasible for large circuits; therefore, circuit partitioning becomes a necessary step to address the analysis. Nevertheless, partition methods imply approximations that produce inaccurate results. We present a partition method based on disjoint signals that minimizes the error and, in addition, it is easy to carry out. Results show important reductions on the binary decision diagrams (BDD) of the probabilistic model as well as low errors. Furthermore, the BDD reduction ratio shows a tendency to increase with large circuits; whilst error seems to decrease with the circuit size.