A survey of the Hough transform
Computer Vision, Graphics, and Image Processing
Three-dimensional computer vision: a geometric viewpoint
Three-dimensional computer vision: a geometric viewpoint
Matrix computations (3rd ed.)
A Mathematical Introduction to Robotic Manipulation
A Mathematical Introduction to Robotic Manipulation
Real-Time Visual Tracking of Complex Structures
IEEE Transactions on Pattern Analysis and Machine Intelligence
Tracking People with Twists and Exponential Maps
CVPR '98 Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Vision-Based Force Measurement
IEEE Transactions on Pattern Analysis and Machine Intelligence
A Comparison of Affine Region Detectors
International Journal of Computer Vision
Design and Analysis of Experiments
Design and Analysis of Experiments
Real-time Hybrid Tracking using Edge and Texture Information
International Journal of Robotics Research
CAD Model-based Tracking and 3D Visual-based Control for MEMS Microassembly
International Journal of Robotics Research
A stochastic kinematic model of class averaging in single-particle electron microscopy
International Journal of Robotics Research
3D position detection with an FIB-SEM dual beam system
ACELAE'11 Proceedings of the 10th WSEAS international conference on communications, electrical & computer engineering, and 9th WSEAS international conference on Applied electromagnetics, wireless and optical communications
International Journal of Robotics Research
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Robotics continues to provide researchers with an increasing ability to interact with objects at the nanoscale. As microrobotic and nanorobotic technologies mature, more interest is given to computer-assisted or automated approaches to manipulation. Although actuators are currently available that enable displacement resolutions in the subnanometer range, improvements in feedback technologies have not kept pace. Thus, many actuators that are capable of performing nanometer displacements are limited in automated tasks by the lack of suitable feedback mechanisms. This paper proposes the use of a rigid-model-based method for end-effector tracking in a scanning electron microscope to aid in enabling more precise automated manipulations and measurements. These models allow the system to leverage domain-specific knowledge to improve performance in a challenging tracking environment.