A taylor series methodology for analyzing the effects of process variation on circuit operation

Authors:
Raghuram Srinivasan;Harold W. Carter
Affiliations:
University of Cincinnati, Cincinnati, OH, USA;University of Cincinnati, Cincinnati, OH, USA
Venue:
Proceedings of the 19th ACM Great Lakes symposium on VLSI
Year:
2009

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Abstract

We present a methodology that can analyze the effect of process variations without requiring the repeated simulations of a Monte Carlo type method. A graph theoretic procedure is described to obtain an explicit differential equation from the differential algebraic equations modeling a circuit netlist. With this explicit form, Taylor series polynomials are used to represent the system variables. The non-constant process parameters are represented as intervals, the Taylor series expansion is used to perform interval computations to generate bounds for the system variables. Methods are discussed to prevent blow-up of intervals during the time marching method.