AVPGEN—a test generator for architecture verification
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Modeling design constraints and biasing in simulation using BDDs
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Deriving a simulation input generator and a coverage metric from a formal specification
Proceedings of the 39th annual Design Automation Conference
On the Random Walk Method for Protocol Testing
CAV '94 Proceedings of the 6th International Conference on Computer Aided Verification
System Verilog for Design: A Guide to Using System Verilog for Hardware Design and Modeling
System Verilog for Design: A Guide to Using System Verilog for Hardware Design and Modeling
State space exploration using feedback constraint generation and Monte-Carlo sampling
Proceedings of the the 6th joint meeting of the European software engineering conference and the ACM SIGSOFT symposium on The foundations of software engineering
Stimulus generation for constrained random simulation
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Application of Formal Word-Level Analysis to Constrained Random Simulation
CAV '08 Proceedings of the 20th international conference on Computer Aided Verification
Towards efficient sampling: exploiting random walk strategies
AAAI'04 Proceedings of the 19th national conference on Artifical intelligence
Querying uncertain data with aggregate constraints
Proceedings of the 2011 ACM SIGMOD International Conference on Management of data
Proceedings of the International Conference on Computer-Aided Design
A robust general constrained random pattern generator for constraints with variable ordering
Proceedings of the International Conference on Computer-Aided Design
Proceedings of the 50th Annual Design Automation Conference
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We describe a Markov chain Monte Carlo (MCMC)-based algorithm for sampling solutions to mixed Boolean/integer constraint problems. The focus of this work differs in two points from traditional SAT Modulo Theory (SMT) solvers, which are aimed at deciding whether a given set of constraints is satisfiable: First, our approach targets constraint problems that have a large solution space and thus are relatively easy to satisfy, and second, it aims at efficiently producing a large number of samples with a given (e.g. uniform) distribution over the solution space. Our work is motivated by the need for such samplers in constrained random simulation for hardware verification, where the set of valid input stimuli is specified by a "testbench" using declarative constraints. MCMC sampling is commonly applied in statistics and numerical computation. We discuss how an MCMC sampler can be adapted for the given application, specifically, how to deal with non-connected solution spaces, efficiently process equality and disequality constraints, handle state-dependent constraints, and avoid correlation of consecutive samples. We present a set of experiments to analyze the performance of the proposed approach.