Electromigration study of power-gated grids

Authors:
Aida Todri;Malgorzata Marek-Sadowska
Affiliations:
University of California Santa Barbara, Santa Barbara, CA, USA;University of California Santa Barbara, Santa Barbara, CA, USA
Venue:
Proceedings of the 14th ACM/IEEE international symposium on Low power electronics and design
Year:
2009

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Abstract

We present a reliability study of power grids in power-gated chips. We investigate those conditions that cause electromigration (EM) problems on the top metal layers as well as in local power grid meshes. Also, we identify the potential EM constraint violating branches and vias by observing their current flow under various power gating conditions. Power supply noise, process and thermal variations are some of the factors that can also affect EM in power grid branches and vias. Our study shows that a power grid network optimized for all blocks working may experience EM problems when power gating is applied.