Finding minimum-cost circulations by canceling negative cycles
Journal of the ACM (JACM)
A current driven routing and verification methodology for analog applications
Proceedings of the 37th Annual Design Automation Conference
Single step current driven routing of multiterminal signal nets for analog applications
DATE '00 Proceedings of the conference on Design, automation and test in Europe
An electromigration and thermal model of power wires for a priori high-level reliability prediction
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Electromigration Reliability Comparison of Cu and Al Interconnects
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Current-driven wire planning for electromigration avoidance in analog circuits
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
introduction to electromigration-aware physical design
Proceedings of the 2006 international symposium on Physical design
Computational Geometry: Algorithms and Applications
Computational Geometry: Algorithms and Applications
Electromigration study of power-gated grids
Proceedings of the 14th ACM/IEEE international symposium on Low power electronics and design
Introduction to Algorithms, Third Edition
Introduction to Algorithms, Third Edition
FOARS: FLUTE based obstacle-avoiding rectilinear steiner tree construction
Proceedings of the 19th international symposium on Physical design
Optimal wiring topology for electromigration avoidance considering multiple layers and obstacles
Proceedings of the 19th international symposium on Physical design
New algorithms for the rectilinear Steiner tree problem
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Static electromigration analysis for on-chip signal interconnects
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Obstacle-Avoiding Rectilinear Steiner Tree Construction Based on Spanning Graphs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Multilayer Obstacle-Avoiding Rectilinear Steiner Tree Construction Based on Spanning Graphs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Berkeley reliability tools-BERT
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Due to excessive current densities, electromigration (EM) may trigger a permanent open- or short-circuit failure in signal wires or power networks in analog or mixed-signal circuits. As the feature size keeps shrinking, this effect becomes a key reliability concern. Hence, in this paper, we focus on wiring topology generation for avoiding EM at the routing stage. Prior works tended towards heuristics; on the contrary, we first claim this problem belongs to class P instead of class NP-hard. Our breakthrough is, via the proof of the greedy-choice property, we successfully model this problem on a multi-source multi-sink flow network and then solve it by a strongly polynomial time algorithm. Experimental results prove the effectiveness and efficiency of our algorithm.