Optimum design of reliable IC power networks having general graph topologies
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Introductory circuit analysis (9th ed.)
Introductory circuit analysis (9th ed.)
Design of robust global power and ground networks
Proceedings of the 2001 international symposium on Physical design
Fast power/ground network optimization based on equivalent circuit modeling
Proceedings of the 38th annual Design Automation Conference
On-chip power supply network optimization using multigrid-based technique
Proceedings of the 40th annual Design Automation Conference
ISQED '02 Proceedings of the 3rd International Symposium on Quality Electronic Design
A multigrid-like technique for power grid analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electromigration study of power-gated grids
Proceedings of the 14th ACM/IEEE international symposium on Low power electronics and design
Reliability analysis and optimization of power-gated ICs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Reliability-Driven Power/Ground Routing for Analog ICs
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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Power gating is an efficient technique for reducing leakage power in electronic devices by disconnecting blocks idle for long periods of time from the power supply. Disconnecting gated blocks causes changes in densities of currents flowing through a grid. Even in DC conditions, current densities in some grid branches may increase for some gating configurations to the extent of violating electromigration (EM) constraints. The existing DC methods for grid sizing optimize the grid area under voltage drop (IR) and EM constraints for one configuration of circuit blocks connected to the grid. We show that these methods cannot be directly applied for optimizing power-gated grids. We analyze the effects of EM and IR voltage drop in power grids with multiple power gating configurations. Based on our analyses, we develop a grid sizing algorithm to satisfy all reliability constraints for all feasible gating configurations. Our experimental results indicate that a grid initially sized for all blocks present may be modified to fulfill EM and IR constraints for multiple gating schedules with only a small area increase.