Optimum design of reliable IC power networks having general graph topologies
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Digital integrated circuits: a design perspective
Digital integrated circuits: a design perspective
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Introductory circuit analysis (9th ed.)
Introductory circuit analysis (9th ed.)
Design of robust global power and ground networks
Proceedings of the 2001 international symposium on Physical design
Fast power/ground network optimization based on equivalent circuit modeling
Proceedings of the 38th annual Design Automation Conference
Introduction to Algorithms
Fast analysis and optimization of power/ground networks
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
On-chip power supply network optimization using multigrid-based technique
Proceedings of the 40th annual Design Automation Conference
ISQED '02 Proceedings of the 3rd International Symposium on Quality Electronic Design
Benefits and Costs of Power-Gating Technique
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Analysis and optimization of power-gated ICs with multiple power gating configurations
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
A multigrid-like technique for power grid analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On old and new routing problems
Proceedings of the 2011 international symposium on Physical design
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Power gating is an efficient technique for reducing the leakage power of electronic devices by disconnecting the power supply from blocks idle for long periods of time. Disconnecting gated blocks causes changes in the current densities of the grid branches and vias. For some gating configurations, dc current densities may increase in some grid locations to the extent that they violate electromigration (EM) constraints. In this paper, we analyze the EM and infrared (IR) voltage drop effects in gated global power grids. Based on our analyses, we develop a global grid sizing algorithm to satisfy the reliability constraints on grid branches and vias for all feasible gating configurations. Our experimental results indicate that a grid initially sized for all blocks connected to it may be modified to fulfill EM and IR constraints for multiple gating schedules with only a small area increase.