Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings

  • Authors:
  • Xiang-Dong Tan;C.-J. Richard Shi;Dragos Lungeanu;Jyh-Chwen Lee;Li-Pen Yuan

  • Affiliations:
  • Department of Electrical Engineering, University of Washington Seattle, WA;Department of Electrical Engineering, University of Washington Seattle, WA;Department of Electrical Engineering, University of Washington Seattle, WA;Avant! Corporation, 46871 Bayside Parkway, Fremont, CA;Avant! Corporation, 46871 Bayside Parkway, Fremont, CA

  • Venue:
  • Proceedings of the 36th annual ACM/IEEE Design Automation Conference
  • Year:
  • 1999

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Abstract