Influence on LSI package wireability of via availability and wiring track accessibility

  • Authors:
  • J. H. Koch;W. F. Mikhail;W. R. Heller

  • Affiliations:
  • IBM General Technology Division laboratory, Hopewell Junction, New York;IBM General Technology Division laboratory, Hopewell Junction, New York;IBM Data Systems Division laboratory, Poughkeepsie, New York

  • Venue:
  • IBM Journal of Research and Development
  • Year:
  • 1982

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Abstract

The introduction of the high performance T2L device technology for the IBM 4300 Systems and the System/38 required extensions of the 24-mm metallized ceramic module used in prior IBM systems. The extension of the metallized ceramic technology ...