Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings
IEEE Design & Test
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
A process-tolerant cache architecture for improved yield in nanoscale technologies
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
New Generation of Predictive Technology Model for Sub-45nm Design Exploration
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Accurate and efficient regression modeling for microarchitectural performance and power prediction
Proceedings of the 12th international conference on Architectural support for programming languages and operating systems
Mitigating the Impact of Process Variations on Processor Register Files and Execution Units
Proceedings of the 39th Annual IEEE/ACM International Symposium on Microarchitecture
ReVIVaL: A Variation-Tolerant Architecture Using Voltage Interpolation and Variable Latency
ISCA '08 Proceedings of the 35th Annual International Symposium on Computer Architecture
Applied inference: Case studies in microarchitectural design
ACM Transactions on Architecture and Code Optimization (TACO)
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Process variations are a major hurdle for continued technology scaling. Both systematic and random variations will affect the critical delay of fabricated chips, causing a wide frequency and power distribution. Tuning techniques adapt the microarchitecture to mitigate the impact of variations at post-fabrication testing time. This paper proposes a new post-fabrication testing framework that accounts for testing costs. This framework uses on-chip canary circuits to capture systematic variation while using statistical analysis to estimate random variation. We derive regression models to predict chip performance and power. These techniques comprise an integrated framework that identifies the most energy efficient post-fabrication tuning configuration for each chip.