Variability in sub-100nm SRAM designs
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
A nondestructive self-reference scheme for spin-transfer torque random access memory (STT-RAM)
Proceedings of the Conference on Design, Automation and Test in Europe
Emerging sensing techniques for emerging memories
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Universal statistical cure for predicting memory loss
Proceedings of the International Conference on Computer-Aided Design
Spin-transfer torque magnetic random access memory (STT-MRAM)
ACM Journal on Emerging Technologies in Computing Systems (JETC) - Special issue on memory technologies
Cross-layer racetrack memory design for ultra high density and low power consumption
Proceedings of the 50th Annual Design Automation Conference
C1C: A configurable, compiler-guided STT-RAM L1 cache
ACM Transactions on Architecture and Code Optimization (TACO)
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A nondestructive self-reference read scheme (NSRS) was recently proposed to overcome the bit-to-bit variation in Spin-Transfer Torque Random Access Memory (STT-RAM). In this work, we introduced three magnetic- and circuit-level techniques, including 1) R-I curve skewing, 2) yield-driven sensing current selection, and 3) ratio matching to improve the sense margin and robustness of NSRS. The measurements of our 16Kb STT-RAM test chip show that compared to the original NSRS design, our proposed technologies successfully increased the sense margin by 2.5X with minimized impacts on the memory reliability and hardware cost.