Behavioral level dual-Vth design for reduced leakage power with thermal awareness

  • Authors:
  • Junbo Yu;Qiang Zhou;Gang Qu;Jinian Bian

  • Affiliations:
  • Tsinghua University, Beijing, China;Tsinghua University, Beijing, China;University of Maryland, College Park;Tsinghua University, Beijing, China

  • Venue:
  • Proceedings of the Conference on Design, Automation and Test in Europe
  • Year:
  • 2010

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Abstract

Dual-Vth design is an effective leakage power reduction technique at behavioral synthesis level. It allows designers to replace modules on non-critical path with the high-Vth implementation. However, the existing constructive algorithms fail to find the optimal solution due to the complexity of the problem and do not consider the on-chip temperature variation. In this paper, we propose a two-stage thermal-dependent leakage power minimization algorithm by using dual-Vth library during behavioral synthesis. In the first stage, we quantitatively evaluate the timing impact on other modules caused by replacing certain modules with high Vth. Based on this analysis and the characteristics of the dual-Vth module library, we generate a small set of candidate solutions for the module replacement. Then in the second stage, we obtain the on-chip thermal information from thermal-aware floorplanning and thermal analysis to select the final solution from the candidate set. Experimental results show an average of 17.8% saving in leakage power consumption and a slightly shorter runtime compared to the best known work. In most cases, our algorithm can actually find the optimal solutions obtained from a complete solution space exploration.