Universal test sets for reversible circuits

Authors:
Satoshi Tayu;Shota Fukuyama;Shuichi Ueno
Affiliations:
Department of Communications and Integrated Systems, Tokyo Institute of Technology, Tokyo, Japan;Department of Communications and Integrated Systems, Tokyo Institute of Technology, Tokyo, Japan;Department of Communications and Integrated Systems, Tokyo Institute of Technology, Tokyo, Japan
Venue:
COCOON'10 Proceedings of the 16th annual international conference on Computing and combinatorics
Year:
2010

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Abstract

A set of test vectors is complete for a reversible circuit if it covers all stuck-at faults on the wires of the circuit. It has been known that any reversible circuit has a surprisingly small complete test set, while it is NP-hard to generate a minimum complete test set for a reversible circuit. A test set is universal for a family of reversible circuits if it is complete for any circuit in the family. We show minimum universal test sets for some families of CNOT circuits.