ASIC test cost/strategy trade-offs

Authors:
Donald L. Wheater;Phil Nigh;Jeanne Trinko Mechler;Luke Lacroix
Affiliations:
IBM Microelectronics Division, Essex Junction, Vermont;IBM Microelectronics Division, Essex Junction, Vermont;IBM Microelectronics Division, Essex Junction, Vermont;IBM Microelectronics Division, Essex Junction, Vermont
Venue:
ITC'94 Proceedings of the 1994 international conference on Test
Year:
1994

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Abstract

Supplying cost effective testing for large application specific integrated circuits (ASICs) is one of the key challenges facing the semiconductor industry. Projections suggest that it will not be cost effective to continue in the current test direction. ASIC suppliers must be able to offer a flexible, cost-effective set of test solutions that will meet a variety of customer requirements. This paper presents some of the trade-offs used in developing optimal test strategies.